Baadel S, Thabtah F, Lu J, Harguem S. OMCOKE: A Machine Learning Outlier-based Overlapping Clustering Technique for Multi-Label Data Analysis. IJCAI [Internet]. 2022 Dec. 15 [cited 2025 Aug. 8];46(4). Available from: https://puffbird.ijs.si/index.php/informatica/article/view/3476