V, Shijina; UNNI, Adithya; JOHN, Sunil Jacob. Similarity measure of multiple sets and its application to pattern recognition. Informatica, [S. l.], v. 44, n. 3, 2020. DOI: 10.31449/inf.v44i3.2872. Disponível em: https://puffbird.ijs.si/index.php/informatica/article/view/2872. Acesso em: 23 jun. 2025.